Anger and energy loss spectroscopy analysis of silicon carbide (SiC) surfaces

Author: Ghamnia M.   Jardin C.   Kadri D.   Bouslama M.  

Publisher: Elsevier

ISSN: 0042-207X

Source: Vacuum, Vol.47, Iss.2, 1996-02, pp. : 141-143

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract