Author: Nagai Y. Saito Y. Matuda N.
Publisher: Elsevier
ISSN: 0042-207X
Source: Vacuum, Vol.47, Iss.6, 1996-06, pp. : 737-739
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Desorption of H 2 and CO 2 from Cu by 5 keV Ar + and H 2 + ion bombardment
By Barnard J.C. Bojko I. Hilleret N.
Vacuum, Vol. 47, Iss. 4, 1996-04 ,pp. :
Ion-induced desorption yield measurements from copper and aluminium
By Lozano M.P.
Vacuum, Vol. 67, Iss. 3, 2002-09 ,pp. :
Desorption of doubly excited autoionizing Li from LiF/Si(100) under electron bombardment
By Markowski L.
Vacuum, Vol. 63, Iss. 1, 2001-07 ,pp. :
Secondary ion emission from silicon under 8 keV O 2 + and Ar + ion bombardment
By Huan C.H.A. Wee A.T.S. Low H.S.M. Tan K.L.
Vacuum, Vol. 47, Iss. 2, 1996-02 ,pp. :