Optical characterization by spectroscopic ellipsometry of polycrystalline Si 1-x Ge x of variable Ge composition up to 100% Ge

By Ferrieu F.   Morin C.   Regolini J.L.  

Thin Solid Films, Vol. 315, Iss. 1, 1998-03 ,pp. : 316-321

Elsevier

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Studies on Ge x Sb 40-x Se 60 glasses by differential scanning calorimetry and thermomechanical analysis

By Ivanova Z.G.   Cernoskova E.   Pamukchieva V.   Shanlova J.  

Thermochimica Acta, Vol. 345, Iss. 1, 2000-02 ,pp. : 13-17

Elsevier

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In situ characterization of thin Si 1-x Ge x films on Si(100) by spectroscopic ellipsometry

By Akazawa H.  

Thin Solid Films, Vol. 369, Iss. 1, 2000-07 ,pp. : 157-160

Elsevier

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Physical evolution and glass forming tendency of Ge 1-x Sn x Se 2.5 amorphous system

By Fouad S.S.   Fayek S.A.   Ali M.H.  

Vacuum, Vol. 49, Iss. 1, 1998-01 ,pp. : 25-30

Elsevier

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Effect of Sn content on the electrical and optical properties of Ge 1-x Sn x Se 3 glasses

By Fadel M.   Sedeek K.   Hegab N.A.  

Vacuum, Vol. 57, Iss. 3, 2000-06 ,pp. : 307-317

Elsevier

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