Effect of vacuum rapid thermal annealing on the properties of SiN x films

Author: Beshkov G.   Dimitrov D.B.   Velchev N.   Petrov P.   Ivanov B.   Zambov L.   Dimitrova T.  

Publisher: Elsevier

ISSN: 0042-207X

Source: Vacuum, Vol.58, Iss.2, 2000-08, pp. : 509-515

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Abstract