An approach to quantitative high-resolution transmission electron microscopy of crystalline materials

Author: Kisielowski C.   Schwander P.   Baumann F.H.   Seibt M.   Kim Y.   Ourmazd A.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.58, Iss.2, 1995-05, pp. : 131-155

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Abstract