Analysis of high resolution transmission electron microscope images of crystalline-amorphous interfaces

Author： Borgardt N.I.   Plikat B.   Seibt M.   Schroter W.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.90, Iss.4, 2002-04, pp. : 241-258

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