Observation of crystal distortions in SiGe/Si superlattice using a new application of large-angle convergent-beam electron diffraction

Author： Atici Y.   Cherns D.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.58, Iss.3, 1995-06, pp. : 435-440

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