Compositional information from amorphous Si-Ge multilayers using high-resolution electron microscopy imaging and direct digital recording

Author： Henning P. Wallenberg L.R. Jarrendahl K. Hultman L. Falk L.K.L. Sundgren J.-E.

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.66, Iss.3, 1996-12, pp. : 221-235

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