The phonon contribution to high-resolution electron microscope images

By Boothroyd C.B.   Yeadon M.  

Ultramicroscopy, Vol. 96, Iss. 3, 2003-09 ,pp. : 361-365

Elsevier

Access to resources Recommend Favorite

Analysis of high resolution transmission electron microscope images of crystalline-amorphous interfaces

By Borgardt N.I.   Plikat B.   Seibt M.   Schroter W.  

Ultramicroscopy, Vol. 90, Iss. 4, 2002-04 ,pp. : 241-258

Elsevier

Access to resources Recommend Favorite

Multiple solution in maximum entropy deconvolution of high resolution electron microscope images

By Huang D.X.   He W.Z.   Li F.H.  

Ultramicroscopy, Vol. 62, Iss. 3, 1996-02 ,pp. : 141-148

Elsevier

Access to resources Recommend Favorite

High-resolution imaging with an aberration-corrected transmission electron microscope

By Lentzen M.   Jahnen B.   Jia C.L.   Thust A.   Tillmann K.   Urban K.  

Ultramicroscopy, Vol. 92, Iss. 3, 2002-08 ,pp. : 233-242

Elsevier

Access to resources Recommend Favorite

Compositional information from amorphous Si-Ge multilayers using high-resolution electron microscopy imaging and direct digital recording

By Henning P.   Wallenberg L.R.   Jarrendahl K.   Hultman L.   Falk L.K.L.   Sundgren J.-E.  

Ultramicroscopy, Vol. 66, Iss. 3, 1996-12 ,pp. : 221-235

Elsevier

Access to resources Recommend Favorite