Reflection scanning near-field optical microscopy (R-SNOM) in constant height mode with a dielectric probe Image interpretation and resolution for high topographic variations

Author： Barchiesi D.   Bergossi O.   Pieralli C.   Spajer M.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.71, Iss.1, 1998-03, pp. : 361-370

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