Polarization effect in scanning near-field optic/atomic-force microscopy (SNOM/AFM)

By Nakajima K.   Mitsuoka Y.   Chiba N.   Muramatsu H.   Ataka T.   Sato K.   Fujihira M.  

Ultramicroscopy, Vol. 71, Iss. 1, 1998-03 ,pp. : 257-262

Elsevier

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Reflection scanning near-field optical microscopy (R-SNOM) in constant height mode with a dielectric probe Image interpretation and resolution for high topographic variations

By Barchiesi D.   Bergossi O.   Pieralli C.   Spajer M.  

Ultramicroscopy, Vol. 71, Iss. 1, 1998-03 ,pp. : 361-370

Elsevier

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Hybrid STM/R-SNOM with novel probe

By Tomanek P.   Brustlova J.   Dobis P.   Grmela L.  

Ultramicroscopy, Vol. 71, Iss. 1, 1998-03 ,pp. : 199-203

Elsevier

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DC electric-field-induced DNA stretching for AFM and SNOM studies

By Kim J.M.   Ohtani T.   Park J.Y.   Chang S.M.   Muramatsu H.  

Ultramicroscopy, Vol. 91, Iss. 1, 2002-05 ,pp. : 139-149

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Calibration of AFM cantilever spring constants

By Gibson C.T.   Weeks B.L.   Abell C.   Rayment T.   Myhra S.  

Ultramicroscopy, Vol. 97, Iss. 1, 2003-10 ,pp. : 113-118

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