The effects of electron and photon scattering on signal and noise transfer properties of scintillators in CCD cameras used for electron detection

Author： R. Meyer R.   Kirkland A.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.75, Iss.1, 1998-10, pp. : 23-33

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Electron detection characteristics of slow-scan CCD camera

By Zuo J.M.  

Ultramicroscopy, Vol. 66, Iss. 1, 1996-11 ,pp. : 21-33

Elsevier

Access to resources Recommend Favorite

Evaluation of gadolinium oxy-sulphide (P43) phosphor used in CCD detectors for electron microscopy

By Faruqi A.R.   Tyrell G.C.  

Ultramicroscopy, Vol. 76, Iss. 1, 1999-02 ,pp. : 69-75

Elsevier

Access to resources Recommend Favorite

A spectral estimation approach to constrast transfer function detection in electron microscopy

By Fernandez J.-J.   Sanjurjo J.R.   Carazo J.-M.  

Ultramicroscopy, Vol. 68, Iss. 4, 1997-08 ,pp. : 267-295

Elsevier

Access to resources Recommend Favorite

Progress in electron Compton scattering

By Schattschneider P.   Exner A.  

Ultramicroscopy, Vol. 59, Iss. 1, 1995-07 ,pp. : 241-253

Elsevier

Access to resources Recommend Favorite

Cooled CCD detector with tapered fibre optics for recording electron diffraction patterns

By Faruqi A.R.   Henderson R.   Subramaniam S.  

Ultramicroscopy, Vol. 75, Iss. 4, 1999-01 ,pp. : 235-250

Elsevier

Access to resources Recommend Favorite