Quantitative determination of the thickness of ferroelectric domain walls using weak beam transmission electron microscopy - Application au titanate de Plomb et aux semi-conducteur III-V, Ph.D. Thesis, EPFL

Author： Foeth M.   Stadelmann P.   Buffat P.-A.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.75, Iss.4, 1999-01, pp. : 203-213

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