Electron energy-loss spectroscopic profiling of thin film structures: 0.39nm line resolution and 0.04eV precision measurement of near-edge structure shifts at interfaces

By Walther T.  

Ultramicroscopy, Vol. 96, Iss. 3, 2003-09 ,pp. : 401-411

Elsevier

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A quantitative approach for spatially-resolved electron energy-loss spectroscopy of grain boundaries and planar defects on a subnanometer scale

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Core-hole effects on energy-loss near-edge structure

By Duscher G.   Buczko R.   Pennycook S.J.   Pantelides S.T.  

Ultramicroscopy, Vol. 86, Iss. 3, 2001-02 ,pp. : 355-362

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Electron energy-loss near-edge structures of 3d transition metal oxides recorded at high-energy resolution

By Mitterbauer C.   Kothleitner G.   Grogger W.   Zandbergen H.   Freitag B.   Tiemeijer P.   Hofer F.  

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Density-functional modelling of core-hole effects in electron energy-loss near-edge spectra

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