Surface structural sensitivity of convergent-beam RHEED: Si (001) 2x1 models compared with dynamical simulations

Author： Zuo J.M. Weierstall U. Peng L.M. Spence J.C.H.

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.81, Iss.3, 2000-04, pp. : 235-244

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