Impact of column bending in high-resolution transmission electron microscopy on the strain evaluation of GaAs/InAs/GaAs heterostructures

Author： Tillmann K.   Lentzen M.   Rosenfeld R.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.83, Iss.1, 2000-05, pp. : 111-128

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