Impact of interfacial solubility on penetration of metals into dielectrics and the mechanism of failure

Author: Plawsky Joel.  

Publisher: Springer Publishing Company

ISSN: 0957-4522

Source: Journal of Materials Science: Materials in Electronics, Vol.23, Iss.1, 2012-01, pp. : 48-55

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract