Testability Trade-Offs for BIST Data Paths

By Nicolici Nicola  

Journal of Electronic Testing, Vol. 20, Iss. 2, 2004-04 ,pp. : 169-179

Springer Publishing Company

Access to resources Recommend Favorite

A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques

By Appello D.  

Journal of Electronic Testing, Vol. 20, Iss. 1, 2004-02 ,pp. : 79-87

Springer Publishing Company

Access to resources Recommend Favorite

Versatile BIST: An Integrated Approach to On-line/Off-line BIST for Data-Dominated Architectures

By Mukherjee N.  

Journal of Electronic Testing, Vol. 13, Iss. 2, 1998-10 ,pp. : 189-200

Springer Publishing Company

Access to resources Recommend Favorite

Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST

By Liang H-G.  

Journal of Electronic Testing, Vol. 18, Iss. 2, 2002-04 ,pp. : 159-170

Springer Publishing Company

Access to resources Recommend Favorite

Reducing Hard Handover Overhead in Future All-IP Wireless Access Networks

By Barry M A O  

BT Technology Journal, Vol. 22, Iss. 2, 2004-04 ,pp. : 60-68

Springer Publishing Company

Access to resources Recommend Favorite