Journal of Electronic Testing,volume 13,issue 2  (10-2014)

Period of time： 2014年2期

Publisher： Springer Publishing Company

Founded in： 1990

Total resources： 50

ISSN： 0923-8174

Subject： TN Radio Electronics, Telecommunications Technology

Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Journal of Electronic Testing,volume 13,issue 2

Menu

Editorial

By Agrawal V.D. in (1998)

Journal of Electronic Testing,volume 13,issue 2 , Vol. 13, Iss. 2, 1998-10 , pp. 75-75

Springer Publishing Company

Abstract Access to resources Recommend Favorite

Guest Editorial

By Jha N.K. in (1998)

Journal of Electronic Testing,volume 13,issue 2 , Vol. 13, Iss. 2, 1998-10 , pp. 77-77

Springer Publishing Company

Abstract Access to resources Recommend Favorite

Design for Testability Techniques at the Behavioral and Register-Transfer Levels

By dey S. in (1998)

Journal of Electronic Testing,volume 13,issue 2 , Vol. 13, Iss. 2, 1998-10 , pp. 79-91

Springer Publishing Company

Abstract Access to resources Recommend Favorite

High-Level Controllability and Observability Analysis for Test Synthesis

By Hsu F.F. in (1998)

Journal of Electronic Testing,volume 13,issue 2 , Vol. 13, Iss. 2, 1998-10 , pp. 93-103

Springer Publishing Company

Abstract Access to resources Recommend Favorite

RTL Test Justification and Propagation Analysis for Modular Designs

By Makris Y. in (1998)

Journal of Electronic Testing,volume 13,issue 2 , Vol. 13, Iss. 2, 1998-10 , pp. 105-120

Springer Publishing Company

Abstract Access to resources Recommend Favorite

Test Generation Based on High-Level Assertion Specification for PowerPCTM Microprocessor Embedded Arrays

By Wang L-C. in (1998)

Journal of Electronic Testing,volume 13,issue 2 , Vol. 13, Iss. 2, 1998-10 , pp. 121-135

Springer Publishing Company

Abstract Access to resources Recommend Favorite

Synthesis of Native Mode Self-Test Programs

By Shen J. in (1998)

Journal of Electronic Testing,volume 13,issue 2 , Vol. 13, Iss. 2, 1998-10 , pp. 137-148

Springer Publishing Company

Abstract Access to resources Recommend Favorite

Allocation Techniques for Reducing BIST Area Overhead of Data Paths

By Parulkar I. in (1998)

Journal of Electronic Testing,volume 13,issue 2 , Vol. 13, Iss. 2, 1998-10 , pp. 149-166

Springer Publishing Company

Abstract Access to resources Recommend Favorite

High-Level Test Synthesis for Behavioral and Structural Designs

By Papachristou C.A. in (1998)

Journal of Electronic Testing,volume 13,issue 2 , Vol. 13, Iss. 2, 1998-10 , pp. 167-188

Springer Publishing Company

Abstract Access to resources Recommend Favorite

Versatile BIST: An Integrated Approach to On-line/Off-line BIST for Data-Dominated Architectures

By Mukherjee N. in (1998)

Journal of Electronic Testing,volume 13,issue 2 , Vol. 13, Iss. 2, 1998-10 , pp. 189-200

Springer Publishing Company

Abstract Access to resources Recommend Favorite

Previous 1 2 Next Display item(s) per page Total 11 item(s)