Formal Value-Range and Variable Testability Techniques for High-Level Design-For-Testability

By Seshadri S.  

Journal of Electronic Testing, Vol. 16, Iss. 1-2, 2000-02 ,pp. : 131-145

Springer Publishing Company

Access to resources Recommend Favorite

A design for testability approach for nano-CMOS analogue integrated circuits

By Karmani Mouna   Khedhiri Chiraz   Hamdi Belgacem   Man Ka Lok   Tourki Rached  

International Journal of Electronics, Vol. 100, Iss. 6, 2013-06 ,pp. : 837-850

Taylor & Francis Ltd

Access to resources Recommend Favorite

Controller Resynthesis for Testability Enhancement of RTL Controller/Data Path Circuits

By Ravi S.  

Journal of Electronic Testing, Vol. 13, Iss. 2, 1998-10 ,pp. : 201-212

Springer Publishing Company

Access to resources Recommend Favorite

Behavioral-Level DFT via Formal Operator Testability Measures

By Seshadri S.  

Journal of Electronic Testing, Vol. 18, Iss. 6, 2002-12 ,pp. : 595-611

Springer Publishing Company

Access to resources Recommend Favorite

Automated System-Level Test Development for Mixed-Signal Circuits

By Ozev S.  

Analog Integrated Circuits and Signal Processing, Vol. 35, Iss. 2-3, 2003-05 ,pp. : 169-178

Springer Publishing Company

Access to resources Recommend Favorite