RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage

Author: Santos M.B.   Gonçalves F.M.   Teixeira I.C.   Teixeira J.P.  

Publisher: Springer Publishing Company

ISSN: 0923-8174

Source: Journal of Electronic Testing, Vol.18, Iss.2, 2002-04, pp. : 179-187

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Abstract