Author: Santos M.B. Gonçalves F.M. Teixeira I.C. Teixeira J.P.
Publisher: Springer Publishing Company
ISSN: 0923-8174
Source: Journal of Electronic Testing, Vol.18, Iss.2, 2002-04, pp. : 179-187
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
A New Testability Calculation Method to Guide RTL Test Generation
By Raik Jaan
Journal of Electronic Testing, Vol. 21, Iss. 1, 2005-02 ,pp. :
Automatic Test Pattern Generation for Resistive Bridging Faults
By Engelke Piet
Journal of Electronic Testing, Vol. 22, Iss. 1, 2006-02 ,pp. :
A Ring Architecture Strategy for BIST Test Pattern Generation
By Fagot C.
Journal of Electronic Testing, Vol. 19, Iss. 3, 2003-06 ,pp. :