Using RT Level Component Descriptions for Single Stuck-at Hierarchical Fault Simulation

By Navabi Zainalabedin  

Journal of Electronic Testing, Vol. 20, Iss. 6, 2004-12 ,pp. : 575-589

Springer Publishing Company

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Combined Fault Classification and Error Propagation Analysis to Refine RT-Level Dependability Evaluation

By Ammari A.  

Journal of Electronic Testing, Vol. 21, Iss. 4, 2005-08 ,pp. : 365-376

Springer Publishing Company

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Reusing Scan Chains for Test Pattern Decompression

By Dorsch R.  

Journal of Electronic Testing, Vol. 18, Iss. 2, 2002-04 ,pp. : 231-240

Springer Publishing Company

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Partial Scan Testing on the Register-Transfer Level

By Greene B.S.  

Journal of Electronic Testing, Vol. 18, Iss. 6, 2002-12 ,pp. : 613-626

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Multi-Level Fault Injections in VHDL Descriptions: Alternative Approaches and Experiments

By Leveugle R.  

Journal of Electronic Testing, Vol. 19, Iss. 5, 2003-10 ,pp. : 559-575

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