Experimental study and theoretical prediction of aging induced frequency shift of crystal resonators and oscillators

Author: Roh Y.S.   Asiz A.   Zhang W.P.   Xi Y.  

Publisher: Elsevier

ISSN: 0026-2714

Source: Microelectronics Reliability, Vol.43, Iss.12, 2003-12, pp. : 1993-2000

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Abstract