Defect generation in InGaN/GaN light-emitting diodes under forward and reverse electrical stresses

Author： Cao X.A.   Sandvik P.M.   LeBoeuf S.F.   Arthur S.D.  

Publisher： Elsevier

ISSN： 0026-2714

Source： Microelectronics Reliability, Vol.43, Iss.12, 2003-12, pp. : 1987-1991

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