Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling

Author： Desplats R. Eral A. Beaudoin F. Perdu P. Weger A. McManus M. Song P. Stellari F.

Publisher： Elsevier

ISSN： 0026-2714

Source： Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1663-1668

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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