Methodology to evaluate the correspondence between real conditions and accelerated tests of a thyristor system used in a power plant

Author： Guedon A.   Woirgard E.   Zardini C.   Simon G.  

Publisher： Elsevier

ISSN： 0026-2714

Source： Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1853-1858

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