Improving SiC lateral DMOSFET reliability under high field stress

Author： Ayalew T. Gehring A. Park J.M. Grasser T. Selberherr S.

Publisher： Elsevier

ISSN： 0026-2714

Source： Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1889-1894

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