On-chip structures for timing measurement and test

Author： Kinniment D.J.   Maevsky O.V.   Bystrov A.   Russell G.   Yakovlev A.V.  

Publisher： Elsevier

ISSN： 0141-9331

Source： Microprocessors and Microsystems, Vol.27, Iss.9, 2003-10, pp. : 473-483

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