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Microelectronic Engineering, Vol. 66, Iss. 1, 2003-04 ,pp. : 631-636

Elsevier

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Characterization of pulsed laser deposited Ba 0.6 Sr 0.4 TiO 3 on Pt-coated silicon substrates

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Structure and dielectric properties of Bi-doped Ba 0.6 Sr 0.4 TiO 3 thin films fabricated by sol-gel method

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Microelectronic Engineering, Vol. 66, Iss. 1, 2003-04 ,pp. : 835-841

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Structure and dielectric properties of Zr-Al-O thin films prepared by pulsed laser deposition

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