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The Effect of Stress on the Microwave Dielectric Properties of \hbox{Ba}_{0.5}\hbox{Sr}_{0.5}\hbox{TiO}_{3} Thin Films

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Calculation of the intrinsic dead layers thicknesses from Au/Ba 0.5 Sr 0.5 TiO 3 /Pt thin film capacitors

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Microstructural Analysis of X7R-Type BaTiO 3 Multilayer Ceramic Capacitors (MLCCs)

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