MOVPE growth of (Al,Ga)InP-based laser structures monitored by real-time reflectance anisotropy spectroscopy

Author: Haberland K.   Bhattacharya A.   Zorn M.   Weyers M.   Zettler J.   Richter W.  

Publisher: Springer Publishing Company

ISSN: 1543-186X

Source: Journal of Electronic Materials, Vol.29, Iss.4, 2000-04, pp. : 468-472

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Abstract