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Journal of Electronic Materials, Vol. 27, Iss. 9, 1998-09 ,pp. : 1047-1052

Springer Publishing Company

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Microstructural Characterization of CdTe(211)B/ZnTe/Si(211) Heterostructures Grown by Molecular Beam Epitaxy

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Optical and Structural Properties of CdTe Grown by Molecular Beam Epitaxy at Low Temperature for Resonant-Cavity-Enhanced HgCdTe Detectors

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Misfit relaxation behavior in CdHgTe layers grown by molecular beam epitaxy on CdZnTe substrates

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