Comparison of GaAs grown on standard Si (511) and compliant SOI (511)

Author: Seaford M.   Tomich D.   Eyink K.   Grazulis L.   Mahalingham K.   Yang Z.   Wang W.  

Publisher: Springer Publishing Company

ISSN: 1543-186X

Source: Journal of Electronic Materials, Vol.29, Iss.7, 2000-07, pp. : 906-908

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