Author: Chang F.-L. Lin M.-J. Lee G.-Y. Chen Y.-S. Liaw C.W. Cheng H.-C.
Publisher: Elsevier
ISSN: 0038-1101
Source: Solid-State Electronics, Vol.47, Iss.10, 2003-10, pp. : 1693-1698
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Crane D.
Journal of Electronic Materials, Vol. 40, Iss. 5, 2011-05 ,pp. :
Microelectronics Reliability, Vol. 43, Iss. 9, 2003-09 ,pp. :