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Springer Publishing Company

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Thermal stability of the current transport mechanisms in Ni-based Ohmic contacts on n- and p-implanted 4H-SiC

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Comparison of Current-Voltage Characteristics of n- and p-Type 6H-SiC Schottky Diodes

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Photoelectric properties of p-β-FeSi₂/n-4H-SiC heterojunction near-infrared photodiode

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Characterization of tungsten–nickel simultaneous Ohmic contacts to p- and n-type 4H-SiC

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