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Author: Tsai J.Y. Lu T.C. Wang S.C.
Publisher: Elsevier
ISSN: 0038-1101
Source: Solid-State Electronics, Vol.47, Iss.10, 2003-10, pp. : 1825-1828
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By Mendizabal L. Verneuil J.L. Bechou L. Aupetit-Berthelemot C. Deshayes Y. Verdier F. Dumas J.M. Danto Y. Laffitte D. Goudard J.L. Hernandez Y.
Microelectronics Reliability, Vol. 43, Iss. 9, 2003-09 ,pp. :