The role of interface states and series resistance on the I-V and C-V characteristics in Al/SnO 2 /p-Si Schottky diodes

Author： Altindal S.   Karadeniz S.   Tugluoglu N.   Tataroglu A.  

Publisher： Elsevier

ISSN： 0038-1101

Source： Solid-State Electronics, Vol.47, Iss.10, 2003-10, pp. : 1847-1854

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