Measurement of the size of embedded metal clusters by mass spectrometry, transmission electron microscopy, and small-angle X-ray scattering

Author: Hendrich C.   Favre L.   Ievlev D.N.   Dobrynin A.N.   Bras W.   Hörmann U.   Piscopiello E.   Van Tendeloo G.   Lievens P.   Temst K.  

Publisher: Springer Publishing Company

ISSN: 0947-8396

Source: Applied Physics A, Vol.86, Iss.4, 2007-03, pp. : 533-538

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