Characterization of electronic materials and devices by scanning near-field microscopy

Author: Balk L.J.   Heiderhoff R.   Phang J.C.H.   Thomas Ch.  

Publisher: Springer Publishing Company

ISSN: 0947-8396

Source: Applied Physics A, Vol.87, Iss.3, 2007-06, pp. : 443-449

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Abstract