Surface layer in CR-39 plastic track detector where the bulk etch rate is enhanced

Author: Yamauchi T.   EL-Rahmany A.   Mineyama D.   Nakai H.   Oda K.  

Publisher: Elsevier

ISSN: 1350-4487

Source: Radiation Measurements, Vol.37, Iss.2, 2003-04, pp. : 119-125

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract