Composition profiling at the atomic scale in III-V nanostructures by cross-sectional STM

Author: Koenraad P.M.   Bruls D.M.   Davies J.H.   Gill S.P.A.   Long F.   Hopkinson M.   Skolnick M.   Wolter J.H.  

Publisher: Elsevier

ISSN: 1386-9477

Source: Physica E, Vol.17, Iss.unknown, 2003-04, pp. : 526-532

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