Period of time: 2014年3期
Publisher: MAIK Nauka/Interperiodica
Founded in: 1972
Total resources: 32
ISSN: 1063-7397
Subject: TN Radio Electronics, Telecommunications Technology
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Russian Microelectronics,volume 40,issue 3
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CMOS logic elements with increased failure resistance to single-event upsets
By Ol'chev S.,Stenin V. in (2011)
Russian Microelectronics,volume 40,issue 3 , Vol. 40, Iss. 3, 2011-05 , pp.Modeling of recombination in SiO2 under the effect of ionizing radiation by the Monte Carlo method
By Polunin V.,Sogoyan A. in (2011)
Russian Microelectronics,volume 40,issue 3 , Vol. 40, Iss. 3, 2011-05 , pp.Features of charge formation and relaxation in SOS structures under the effect of ionizing radiation
By Sogoyan A.,Davydov G. in (2011)
Russian Microelectronics,volume 40,issue 3 , Vol. 40, Iss. 3, 2011-05 , pp.By Chistilin A.,Romanov A.,Moskovskaya Yu.,Ulanova A. in (2011)
Russian Microelectronics,volume 40,issue 3 , Vol. 40, Iss. 3, 2011-05 , pp.Electrothermal behavior of the elements of SOS CMOS chips
By Gerasimchuk O.,Epifantsev K.,Pavlova T.,Skorobogatov P. in (2011)
Russian Microelectronics,volume 40,issue 3 , Vol. 40, Iss. 3, 2011-05 , pp.