STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun

By Sawada Hidetaka   Tanishiro Yasumasa   Ohashi Nobuhiro   Tomita Takeshi   Hosokawa Fumio   Kaneyama Toshikatsu   Kondo Yukihito   Takayanagi Kunio  

Journal of Electron Microscopy, Vol. 58, Iss. 6, 2009-12 ,pp. : 357-361

Oxford University Press

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Development of a gas injection/specimen heating holder for use with transmission electron microscope

By Kamino Takeo   Yaguchi Toshie   Konno Mitsuru   Watabe Akira   Marukawa Tomotaka   Mima Takayuki   Kuroda Kotaro   Saka Hiroyasu   Arai Shigeo   Makino Hiroshi   Suzuki Yoshinao   Kishita Keisuke  

Journal of Electron Microscopy, Vol. 54, Iss. 6, 2005-12 ,pp. : 497-503

Oxford University Press

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Performances of an 80200 kV microscope employing a cold-FEG and an aberration-corrected objective lens

By Ricolleau Christian   Nelayah Jaysen   Oikawa Tetsuo   Kohno Yuji   Braidy Nadi   Wang Guillaulle   Hue Florian   Florea Lenuta   Pierron Bohnes Vronique   Alloyeau Damien  

Journal of Electron Microscopy, Vol. 62, Iss. 2, 2013-04 ,pp. : 283-293

Oxford University Press

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CCD camera, real-time image processing, defocus-image modulation processing, phase electron microscope, spherical aberration correction

By Nishikata K  

Journal of Electron Microscopy, Vol. 50, Iss. 3, 2001-05 ,pp. : 271-273

Oxford University Press

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Contrast enhancement in the phase plate transmission electron microscopy using an objective lens with a long focal length

By Minoda Hiroki   Okabe Tatsuhiro   Iijima Hirofumi  

Journal of Electron Microscopy, Vol. 60, Iss. 5, 2011-10 ,pp. : 337-343

Oxford University Press

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