Journal of Electronic Testing,volume 16,issue 3  (06-2014)

Period of time： 2014年3期

Publisher： Springer Publishing Company

Founded in： 1990

Total resources： 50

ISSN： 0923-8174

Subject： TN Radio Electronics, Telecommunications Technology

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Journal of Electronic Testing,volume 16,issue 3

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Editorial

By Agrawal V.D. in (2000)

Journal of Electronic Testing,volume 16,issue 3 , Vol. 16, Iss. 3, 2000-06 , pp. 163-163

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Guest Editorial

By Landrault C. in (2000)

Journal of Electronic Testing,volume 16,issue 3 , Vol. 16, Iss. 3, 2000-06 , pp. 167-167

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A High-Level EDA Environment for the Automatic Insertion of HD-BIST Structures

By Benso A. in (2000)

Journal of Electronic Testing,volume 16,issue 3 , Vol. 16, Iss. 3, 2000-06 , pp. 179-184

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On Random Pattern Testability of Cryptographic VLSI Cores

By Schubert A. in (2000)

Journal of Electronic Testing,volume 16,issue 3 , Vol. 16, Iss. 3, 2000-06 , pp. 185-192

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Low Power BIST by Filtering Non-Detecting Vectors

By Manich S. in (2000)

Journal of Electronic Testing,volume 16,issue 3 , Vol. 16, Iss. 3, 2000-06 , pp. 193-202

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Minimized Power Consumption for Scan-Based BIST

By Gerstendörfer S. in (2000)

Journal of Electronic Testing,volume 16,issue 3 , Vol. 16, Iss. 3, 2000-06 , pp. 203-212

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Fast Test Pattern Generation for Sequential Circuits Using Decision Diagram Representations

By Raik J.,Ubar R. in (2000)

Journal of Electronic Testing,volume 16,issue 3 , Vol. 16, Iss. 3, 2000-06 , pp. 213-226

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Application of Supply Current Testing to Analogue Circuits, Towards a Structural Analogue Test Methodology

By Manhaeve H. in (2000)

Journal of Electronic Testing,volume 16,issue 3 , Vol. 16, Iss. 3, 2000-06 , pp. 227-234

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Experimental Results on BIC Sensors for Transient Current Testing

By Picos R.,Roca M.,Isern E.,Segura J.,García-Moreno E. in (2000)

Journal of Electronic Testing,volume 16,issue 3 , Vol. 16, Iss. 3, 2000-06 , pp. 235-241

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Compaction of IDDQ Test Sequence Using Reassignment Method

By Maeda T.,Kinoshita K. in (2000)

Journal of Electronic Testing,volume 16,issue 3 , Vol. 16, Iss. 3, 2000-06 , pp. 243-249

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