Journal of Electronic Testing,volume 18,issue 6  (12-2014)

Period of time： 2014年6期

Publisher： Springer Publishing Company

Founded in： 1990

Total resources： 50

ISSN： 0923-8174

Subject： TN Radio Electronics, Telecommunications Technology

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Journal of Electronic Testing,volume 18,issue 6

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Editorial

By Agrawal V.D. in (2002)

Journal of Electronic Testing,volume 18,issue 6 , Vol. 18, Iss. 6, 2002-12 , pp. 567-568

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Test Technology Technical Council Newsletter

By in (2002)

Journal of Electronic Testing,volume 18,issue 6 , Vol. 18, Iss. 6, 2002-12 , pp. 569-570

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Structural Fault Based Specification Reduction for Testing Analog Circuits

By Chang S-J. in (2002)

Journal of Electronic Testing,volume 18,issue 6 , Vol. 18, Iss. 6, 2002-12 , pp. 571-581

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Fast Anti-Random (FAR) Test Generation to Improve the Quality of Behavioral Model Verification

By Chen T. in (2002)

Journal of Electronic Testing,volume 18,issue 6 , Vol. 18, Iss. 6, 2002-12 , pp. 583-594

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Behavioral-Level DFT via Formal Operator Testability Measures

By Seshadri S. in (2002)

Journal of Electronic Testing,volume 18,issue 6 , Vol. 18, Iss. 6, 2002-12 , pp. 595-611

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Partial Scan Testing on the Register-Transfer Level

By Greene B.S. in (2002)

Journal of Electronic Testing,volume 18,issue 6 , Vol. 18, Iss. 6, 2002-12 , pp. 613-626

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An Interleaving Technique for Reducing Peak Power in Multiple-Chain Scan Circuits During Test Application

By Lee K-J. in (2002)

Journal of Electronic Testing,volume 18,issue 6 , Vol. 18, Iss. 6, 2002-12 , pp. 627-636

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A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM

By Wang C-W. in (2002)

Journal of Electronic Testing,volume 18,issue 6 , Vol. 18, Iss. 6, 2002-12 , pp. 637-647

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2002 Annual Index

By in (2002)

Journal of Electronic Testing,volume 18,issue 6 , Vol. 18, Iss. 6, 2002-12 , pp. 649-660

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Total 9 item(s)