Quantification of high-resolution electron microscope images of amorphous carbon

By Boothroyd C.B.  

Ultramicroscopy, Vol. 83, Iss. 3, 2000-06 ,pp. : 159-168

Elsevier

Access to resources Recommend Favorite

Analysis of high resolution transmission electron microscope images of crystalline-amorphous interfaces

By Borgardt N.I.   Plikat B.   Seibt M.   Schroter W.  

Ultramicroscopy, Vol. 90, Iss. 4, 2002-04 ,pp. : 241-258

Elsevier

Access to resources Recommend Favorite

Multiple solution in maximum entropy deconvolution of high resolution electron microscope images

By Huang D.X.   He W.Z.   Li F.H.  

Ultramicroscopy, Vol. 62, Iss. 3, 1996-02 ,pp. : 141-148

Elsevier

Access to resources Recommend Favorite

High-resolution imaging with an aberration-corrected transmission electron microscope

By Lentzen M.   Jahnen B.   Jia C.L.   Thust A.   Tillmann K.   Urban K.  

Ultramicroscopy, Vol. 92, Iss. 3, 2002-08 ,pp. : 233-242

Elsevier

Access to resources Recommend Favorite

Limitations on the s-state approach to the interpretation of sub-angstrom resolution electron microscope images and microanalysis

By Anstis G.R.   Cai D.Q.   Cockayne D.J.H.  

Ultramicroscopy, Vol. 94, Iss. 3, 2003-04 ,pp. : 309-327

Elsevier

Access to resources Recommend Favorite