Metastability of SOI CMOS latches

Author: Tretz C.   Chuang C. T.   Terman L.   Anderson C.   Pelella Mario   Zukowski C.  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3060

Source: International Journal of Electronics, Vol.86, Iss.7, 1999-07, pp. : 807-813

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Abstract