Stimulus generation of a built-in self-test using oscillation based test structures

Author： Novak Franc   Santo Zarnik Marina   Kač Uroš  

Publisher： Taylor & Francis Ltd

ISSN： 1362-3060

Source： International Journal of Electronics, Vol.89, Iss.11, 2003-11, pp. : 811-820

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

A low power test pattern generation for built-in self-test based circuits

By Ye Bo  

International Journal of Electronics, Vol. 98, Iss. 3, 2011-03 ,pp. : 301-309

Taylor & Francis Ltd

Access to resources Recommend Favorite

Built-in Self-test and Defect Tolerance in Molecular Electronics-based Nanofabrics

By Wang Zhanglei  

Journal of Electronic Testing, Vol. 23, Iss. 2-3, 2007-06 ,pp. : 145-161

Springer Publishing Company

Access to resources Recommend Favorite

Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test

By Li J-F.  

Journal of Electronic Testing, Vol. 18, Iss. 4-5, 2002-08 ,pp. : 515-527

Springer Publishing Company

Access to resources Recommend Favorite

A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM

By Wang C-W.  

Journal of Electronic Testing, Vol. 18, Iss. 6, 2002-12 ,pp. : 637-647

Springer Publishing Company

Access to resources Recommend Favorite

A Built-in Self-test and Diagnosis Strategy for Chemically Assembled Electronic Nanotechnology

By Brown Jason  

Journal of Electronic Testing, Vol. 23, Iss. 2-3, 2007-06 ,pp. : 131-144

Springer Publishing Company

Access to resources Recommend Favorite