Built-in Self-test and Defect Tolerance in Molecular Electronics-based Nanofabrics
Author： Wang Zhanglei
Publisher： Springer Publishing Company
ISSN： 0923-8174
Source： Journal of Electronic Testing, Vol.23, Iss.2-3, 2007-06, pp. : 145-161
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Access to resources
Recommend
