Innovative Built-In Self-Test Schemes for On-Chip Diagnosis, Compliant with the IEEE 1149.4 Mixed-Signal Test Bus Standard

By Ducoudray-Acevedo G.O.  

Journal of Electronic Testing, Vol. 19, Iss. 1, 2003-02 ,pp. : 21-28

Springer Publishing Company

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Demonstration of an Analog IC Function Maintenance Strategy, Including Direct Calibration, Built-in Self-test, and Commutation of Redundant Functional Blocks

By Current K.W.  

Analog Integrated Circuits and Signal Processing, Vol. 26, Iss. 2, 2001-02 ,pp. : 129-140

Springer Publishing Company

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Stimulus generation of a built-in self-test using oscillation based test structures

By Novak Franc   Santo Zarnik Marina   Kač Uroš  

International Journal of Electronics, Vol. 89, Iss. 11, 2003-11 ,pp. : 811-820

Taylor & Francis Ltd

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A low power test pattern generation for built-in self-test based circuits

By Ye Bo  

International Journal of Electronics, Vol. 98, Iss. 3, 2011-03 ,pp. : 301-309

Taylor & Francis Ltd

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Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test

By Li J-F.  

Journal of Electronic Testing, Vol. 18, Iss. 4-5, 2002-08 ,pp. : 515-527

Springer Publishing Company

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